The Bruker QUANTAX Micro-XRF with XTrace 2 is a cutting-edge micro-XRF system designed to enhance elemental analysis within scanning electron microscopes (SEM). It combines high-energy X-ray excitation with advanced mapping capabilities, enabling precise trace element detection and non-destructive measurement.
Key Features of Bruker QUANTAX Micro-XRF with XTrace 2:
High-Power X-Ray Source for Precise Elemental Analysis
- The 50 W micro-focus X-ray tube generates high-energy X-rays, enabling efficient excitation of both light and heavy elements. This ensures accurate trace element detection, even in complex samples with overlapping spectral lines. The high-power source significantly reduces acquisition time, making analysis faster and more efficient.
Advanced Aperture Management System (AMS) for Topographic Samples
- The patented AMS technology enhances depth of field, allowing precise analysis of topographic and uneven samples. Users can select from six different filters, which help reduce background noise and improve trace element detection. This feature is particularly useful for analyzing rough surfaces, powders, and multilayer structures.
Automated Source Control for Seamless Operation
- The motorized insertion and retraction system ensures smooth integration with SEM workflows. The X-ray source can be automatically inserted when needed and safely retracted when not in use, minimizing manual handling and improving operational efficiency. This automation enhances user convenience while maintaining system longevity.
Exceptional Trace Element Sensitivity
- With detection limits as low as 10 ppm, the QUANTAX Micro-XRF with XTrace 2 provides high-sensitivity elemental analysis. This capability is crucial for applications requiring precise identification of minor and trace elements, such as geological research, semiconductor analysis, and forensic investigations.
Multilayer Sample Characterization for Thin Film Analysis
- The system enables non-destructive analysis of thin films ranging from 1 nm to 40 µm, making it ideal for coating thickness measurements, semiconductor layer analysis, and material science applications. Unlike conventional electron beam excitation, the X-ray source penetrates deeper into the sample, providing more comprehensive data.
Non-Destructive Measurement for Sample Integrity
- Unlike traditional destructive techniques, micro-XRF analysis preserves sample integrity by eliminating the need for extensive preparation. There’s no requirement for carbon coating or conductive surfaces, making it easier to analyze delicate or valuable samples without altering their composition.
High-Speed Elemental Mapping for Large Areas
- The system delivers rapid elemental mapping, even over large sample areas. This feature is particularly beneficial for industrial quality control, geological surveys, and material characterization, where high-throughput analysis is required.
The Bruker QUANTAX Micro-XRF with XTrace 2 transforms elemental analysis by integrating high-resolution micro-XRF capabilities into SEM workflows. With automated source control, trace element sensitivity, and non-destructive measurement, it provides researchers and industries with precise, efficient, and reliable results.
As a cutting-edge solution for material science, semiconductor analysis, and forensic investigations, this system delivers high-speed elemental mapping, multilayer characterization, and topographic sample optimization. Available at Quasi-S, Singapore’s authorized distributor, it stands as the premier choice for professionals seeking advanced micro-XRF performance.
